Anitha, Azhagan GanapathiAzhagan GanapathiAnithaBegum, S. RizwanaS. RizwanaBegumMeenakshi, R.R.MeenakshiPakiyaraj, K.K.PakiyarajRuby, A.A.RubyArun ThirumuruganChidhambaram, NatarajanNatarajanChidhambaram2025-10-102025-10-10202520598521; 273158949781510880320; 9781510872363; 9781510872370; 9781510872325; 9781510872349; 9781510872356; 9781510872332https://hdl.handle.net/20.500.12740/23529This work focuses on ZnO nanocrystals’ magnetic properties at low temperatures. The X-ray diffractogram confirms the hexagonal phase of ZnO, and the average crystallite size is 27 nm. The Fourier Transform Infrared (FTIR) spectrum shows characteristic Zn–O stretching modes, and the bandgap energy of ZnO is 3.27 eV. The photoluminescence spectrum reveals various emission lines due to different defect states, with the near-band-edge emission. Transmission Electron Microscopy (TEM) images show partially spherical and elliptical shapes of ZnO nanocrystals. The High-Resolution Transmission Electron Microscopy (HRTEM) image exhibits an interlayer spacing of 0.246 nm corresponding to the (101) plane. The Magnetization studies show an increase in magnetization with decreasing temperature, with values of 1.70, 1.79, and 1.88 memu/g at room temperature, 200 K, and 100 K, respectively. © 2025 Elsevier B.V., All rights reserved.restrictedAccessATOMIC EMISSION SPECTROSCOPYDEFECT STATESFOURIER TRANSFORM INFRARED SPECTROSCOPYHIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPYLAYERED SEMICONDUCTORSNANOCLAYNANOCRYSTALSNANOMAGNETICSPHOTOLUMINESCENCEPHOTOLUMINESCENCE SPECTROSCOPYWIDE BAND GAP SEMICONDUCTORSX RAY DIFFRACTION ANALYSISDEFECT LEVELSFOURIER TRANSFORM INFRARED SPECTRAHEXAGONAL PHASISLOWS-TEMPERATURESPROPERTYSTRETCHING MODESTRANSMISSION ELECTRON MICROSCOPY IMAGESX-RAY DIFFRACTOGRAMSZNOZNO NANOCRYSTALCRYSTALLITE SIZEArtículo https://doi.org/10.1557/s43580-025-01211-0